Project information
Anomalous x-ray scattering from semiconductor nanostructures
- Project Identification
- GA202/03/0148
- Project Period
- 1/2003 - 1/2005
- Investor / Pogramme / Project type
-
Czech Science Foundation
- Standard Projects
- MU Faculty or unit
- Faculty of Science
- Keywords
- quantum dots, x-ray diffraction, anomalous x-ray scattering
Size, shape and chemical composition of self-organized quauntum dots in
semiconductor superlattices are important parameters influencing their
electronic and optical performace. In this project, we intend to study
these properties using anomalous x-ray scattering and x-ray fluorescence
excited by a standing x-ray wave during x-ray diffraction. Magnetic
properties of the quantum dots will be investigated by magnetic x-ray
dichroism and resonant magnetic x-ray scattering. The experimental results
will be analyzed using a suitable structure model and compared with the
results of photoluminescence and magnetometry measurements. We expect to
obtain a detailed information on the shape and inhomoneneity of the
chemical composition of the dots. For the magnetic dots, an information on
the magnetic ordering of the crystal lattice of the dot will be obtained
as well as a possible magnetic interaction between the dots.
Publications
Total number of publications: 13
2005
-
Anomalous X-ray diffraction from self-assembled PbSe/PbEuTe quantum dots
Journal of Alloys and Compounds, year: 2005, volume: 401, edition: 1-2
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Diffuse X-ray scattering from misfit and threading dislocations in relaxed epitaxial layers
Journal of Alloys and Compounds, year: 2005, volume: 401, edition: 1-2
-
Patterson-like analysis of diffuse x-ray scattering from epitaxial mosaic PbTe layers on Si(111)
Journal of Applied Physics, year: 2005, volume: 98, edition: 10
-
Spontaneous lateral modulation in short-period superlattices investigated by grazing-incidence X-ray diffraction
Physical Review B, year: 2005, volume: 72, edition: 3
-
X-ray diffraction from polycrystalline multilayers in grazing-incidence geometry: Measurement of crystallite size depth distribution
Physical Review B, year: 2005, volume: 72, edition: 17
-
X-ray scattering methods for the study of epitaxial self-assembled quantum dots
Quantum dots: Fundamentals, applications and frontiers, edition: Vyd. 1., year: 2005, number of pages: 25 s.
2004
-
3D hexagonal versus trigonal ordering in self-organized PbSe quantum dot superlattices
Physica E, year: 2004, volume: 21, edition: 11
-
Ordering parameters of self-organized three-dimensional quantum-dot lattices determined from anomalous x-ray diffraction
Appl. Phys. Lett., year: 2004, volume: 84, edition: 6
-
Shape and composition change of Ge dots due to Si capping
Applied Surface Science, year: 2004, volume: 224, edition: 2
-
X-ray diffraction on laterally modulated (InAs)n/(AlAs)m short-period superlattices
Journal of Applied Physics, year: 2004, volume: 96, edition: 9