Electronic band structure of Sb2Te3

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Authors

MOHELSKY I. WYZULA J. LE MARDELÉ F. ABADIZAMAN Farzin CAHA Ondřej DUBROKA Adam SUN X. D. CHO C. W. PIOT B. A. TANZIM M. F. AGUILERA I. BAUER G. SPRINGHOLZ G. ORLITA M.

Year of publication 2024
Type Article in Periodical
Magazine / Source Physical Review B
MU Faculty or unit

Faculty of Science

Citation
web https://doi.org/10.1103/PhysRevB.109.165205
Doi http://dx.doi.org/10.1103/PhysRevB.109.165205
Keywords Landau levels; Topological insulators; Narrow band gap systems; Cyclotron resonance
Attached files
Description We report on Landau-level spectroscopy of an epitaxially grown thin film of the topological insulator Sb2Te3, complemented by ellipsometry and magnetotransport measurements. The observed response suggests that Sb2Te3 is a direct-gap semiconductor with the fundamental band gap located at the I' point or along the trigonal axis, and its width reaches Eg = (190 +/- 10) meV at low temperatures. Our data also indicate the presence of other low-energy extrema with a higher multiplicity in both the conduction and valence bands. The conclusions based on our experimental data are confronted with and to a great extent corroborated by the electronic band structure calculated using the GW method.
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