Matrix formalism for imperfect thin films

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Authors	OHLÍDAL Ivan FRANTA Daniel
Year of publication	2000
Type	Article in Periodical
Magazine / Source	Acta physica slovaca
MU Faculty or unit	Faculty of Science
Citation
Web	http://hydra.physics.muni.cz/~franta/bib/APS50_489.html
Field	Solid matter physics and magnetism
Description	In this review paper a uniform matrix formalism enabling us to include the important defects of thin film systems into the formulae for their optical quantities is presented. The following defects are discussed: roughness of the boundaries; inhomogeneity represented by profiles of the refractive indices; transition interface layer and volume inhomogeneity. It is shown that this formalism is relatively very efficient. Thus fact is demonstrated using a theoretical example representing a complicated thin film system exhibiting defects.
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