Calculation of the optical quantities characterizing inhomogeneous thin film using a new mathematical procedure based on the matrix formalism and Drude approximation
| Authors | |
|---|---|
| Year of publication | 2001 |
| Type | Article in Proceedings |
| Conference | 12th Czech-Slovak-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics |
| MU Faculty or unit | |
| Citation | |
| Web | http://hydra.physics.muni.cz/~franta/bib/SPIE4356_207.html |
| Field | Optics, masers and lasers |
| Keywords | inhomogeneous thin films; optical quantities; matrix formalism; Drude approximation |
| Description | In this contribution a new mathematical procedure enabling us to calculate the optical quantities of the inhomogeneous thin films such as reflectance, transmittance and ellipsometric parameters will be described. This procedure is based on combining the known matrix formalism and Drude approximation. The inhomogeneous thin films is replaced by a multilayer system containing the thin films with a linear profiles of the dielectric function and different thicknesses. Every individual film of the multilayer system is described by the matrix corresponding to the Drude approximation. Using this procedure one can construct an efficient algorithm allowing to calculate the values of the optical quantities of the inhomogeneous thin films exhibiting great gradients of the refractive index profiles. |
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