Structural investigation of semiconductor nanostructures by x-ray techniques

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Authors	STANGL Julian HESSE Anke ROCH Tomáš HOLÝ Václav
Year of publication	2002
Type	Article in Periodical
Magazine / Source	Nuclear Instruments & Methods in Physics Research A
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	Structural investigation of semiconductor nanostructures by x-ray techniques
Description	Structural investigation of semiconductor nanostructures by x-ray techniques
Related projects:	Self-organization processes on the interfaces during epitaxial growth of semiconductor superlattices Physical properties of new materials and layered structures