Optical constants of ZnTe and ZnSe epitaxial thin films

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Authors	FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut
Year of publication	2003
Type	Article in Periodical
Magazine / Source	Acta Physica Slovaca
MU Faculty or unit	Faculty of Science
Citation
Web	http://hydra.physics.muni.cz/~franta/bib/APS53_95.html
Field	Solid matter physics and magnetism
Keywords	SPECTROSCOPIC ELLIPSOMETRY; MATRIX FORMALISM; CARBON-FILMS; MULTISAMPLE; GAAS
Description	In this paper the spectral dependences of the optical constants, i.e. refractive index and extinction coefficient, are presented within the spectral region 220-850 nm. For determining these spectral dependences a multi-sample modification of the combined optical method based on a simultaneous interpretation of experimental data corresponding to variable angle spectro-scopic ellipsometry and near-normal spectroscopic reflectometry is used. Further, physical models and an iterative procedure enabling us to determine the spectral dependences of the optical constants of both the epitaxial films are described in detail. The spectral dependences of the optical constants are introduced in the forms of curves and tables.
Related projects:	Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method