Srovnání snímků NSOM a AFM při studiu vybraných objektů

Warning

This publication doesn't include Institute of Computer Science. It includes Faculty of Science. Official publication website can be found on muni.cz.

Title in English	Comparison of NSOM and AFM images of chosen samples
Authors	KLAPETEK Petr OHLÍDAL Ivan
Year of publication	2003
Type	Article in Periodical
Magazine / Source	Československý časopis pro fyziku
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	NSOM; AFM
Description	In this article artifacts in near-field scanning optical microscopy are shown and their origin due to topography irregularities is demonstrated.
Related projects:	Realisation of thelaboratory instrument for surface roughness measurement by holographic interferometry Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method