Atomic force microscopy characterization of ZnTe epitaxial thin films

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Authors	KLAPETEK Petr OHLÍDAL Ivan MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut
Year of publication	2003
Type	Article in Periodical
Magazine / Source	Japanese Journal of Applied Physics
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	ZnTe epitaxial films; AFM analysis; faceted boundaries
Description	In this paper, results concerning atomic force microscopy studies of the upper bounaries of ZnTe epitaxial thin films prepared by molecular beam epitaxy onto gallium arsenide single crystal substrates are presented. It is sohw that the upper boundaries exhibit faceted structure which is described by means of statistical analysis.
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