Application of the wavelet transformation in AFM data analysis

Warning

This publication doesn't include Institute of Computer Science. It includes Faculty of Science. Official publication website can be found on muni.cz.

Authors	KLAPETEK Petr OHLÍDAL Ivan
Year of publication	2005
Type	Article in Periodical
Magazine / Source	Acta Physica Slovaca
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	AFM; Wavelet transform
Description	In this article the possibilities of the wavelet transform use within atomic force microscopy data processing are presented. Both discrete and continuous wavelet transform is used for different processing and analytical purposes including denoising, AFM scan error detection, background removal and multifractal analysis. It is shown that the use of wavelet transform can be very effective within AFM data analysis, namely for highly irregular data.
Related projects:	Vývoj metod pro charakterizaci defektů na površích pevných látek Study of plasmachemical reactions in non-isothermic low pressure plasma and its interaction with the surface of solid substrates