Diffraction effects in infrared ellipsometry of conducting samples
| Název česky | Difrakční efekty v infračervené elipsometrii vodivých vzorků |
|---|---|
| Autoři | |
| Rok publikování | 2004 |
| Druh | Článek v odborném periodiku |
| Časopis / Zdroj | Thin Solid Films |
| Fakulta / Pracoviště MU | |
| Citace | |
| Obor | Fyzika pevných látek a magnetismus |
| Klíčová slova | Infrared ellipsometry; Diffraction; Metals |
| Popis | We investigate theoretically polarization effects occurring in infrared spectra of finite-size conducting samples. In ellipsometric data taken at grazing incidence, a strong influence of sample edges is observed even for sample dimensions of several hundreds of a wavelength. As usual, the ellipsometric technique is found to be very efficient in supplying both magnitudes and phases of the polarized light waves. We present a comparison of the calculations with experimental far-infrared data of copper. |
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