Go to main content | Go to main menu | Go to search

Project information
Characterization of multilayer systems with randomly rough boundaries by means of optical and X - ray methods

Information

This project doesn't include Institute of Computer Science. It includes Faculty of Science. Official project website can be found on muni.cz.
Investor logo
Project Identification
GA202/98/0988
Project Period
1/1998 - 1/2000
Investor / Pogramme / Project type
Czech Science Foundation
  • Standard Projects
MU Faculty or unit
Faculty of Science
Cooperating Organization
Institute of Scientific Instruments of the ASCR, v. v. i.
  • Responsible person RNDr. Pavel Pokorný
Brno University of Technology
  • Responsible person prof. RNDr. Miloslav Ohlídal, CSc.

Within both perturbation and diffraction theories new theoretical approaches enabling us to express optical quantities of multilayer systems with randomly rough boundaries will be formulated. These quantities will be connected with coherently and incoher ently scattered light. The theoretical results will be compared with experimental results achieved for chosen rough multilayer systems. Analytical methods allowing a determination of the optical and statistical parameters of the systems mentioned will be developed. Moreover, a comparison of the new theoretical approach developed within the perturbation theory with approaches employed in the X-ray region will be carried out. Possibilities concerning an extension of this optical approach to the X-ray regi on will also be investigated. A combination of optical and X-ray methods will be used for analyzing various thin film systems.

Publications

Total number of publications: 34

1999

1998

Previous 1 2 3 4 Next

You are running an old browser version. We recommend updating your browser to its latest version.

More info