Optical properties of thin films of poly(methyl-phenylsilylene)
| Authors | |
|---|---|
| Year of publication | 1999 |
| Type | Article in Periodical |
| Magazine / Source | Optical Materials |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Description | We report the results of optical studies of thin films of poly(methyl-phenylsilylene) prepared on single-crystalline silicon and fused quartz substrates using the casting and spin coating technology. From near-normal incidence reflectance, we have determined the spectral dependence of the complex dielectric function and the complex refractive index in the energy interval from 1 to 7 eV. |
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