Optical Characterization of Chalcogenide Thin Films

Warning

This publication doesn't include Institute of Computer Science. It includes Faculty of Science. Official publication website can be found on muni.cz.

Authors	FRANTA Daniel OHLÍDAL Ivan FRUMAR Miloslav JEDELSKÝ Jaroslav
Year of publication	2001
Type	Article in Periodical
Magazine / Source	Applied Surface Science
MU Faculty or unit	Faculty of Science
Citation
Web	http://hydra.physics.muni.cz/~franta/bib/ASS175_555.html
Field	Solid matter physics and magnetism
Keywords	Chalcogenide films; Dispersion model; Ellipsometry; Reflectometry
Description	In this paper the optical characterization of a film of amorphous As-S chalcogenides evaporated on glass substrates will be performed using variable angle of incidence spectroscopic ellipsometry (VASE) and near normal incidence spectroscopic reflectometry (NNSR). The spectral dependences of the ellipsometric parameters and reflectance of the chalcogenide thin film mentioned is measured within the near-UV, visible and near-IR spectral regions. For interpreting these optical quantities the new dispersion model of the spectral dependences of the optical constants of amorphous solids is employed. This model is based on the modified Lorentz oscillator. Within this model the concepts of the band gap and Urbach tail are respected.
Related projects:	Optical properties of glasses and amorphous thin films of sulphides and selenides