Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices

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Authors	HOLÝ Václav MEDUŇA Mojmír ROCH Tomáš BAUER Guenther
Year of publication	2002
Type	Article in Periodical
Magazine / Source	Semicond. Sci. Technol.
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices
Description	Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices
Related projects:	Self-organization processes on the interfaces during epitaxial growth of semiconductor superlattices Physical properties of new materials and layered structures