Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)

Warning

This publication doesn't include Institute of Computer Science. It includes Faculty of Science. Official publication website can be found on muni.cz.

Authors	BONAVENTUROVÁ ZRZAVECKÁ Olga NEBOJSA Alois NAVRÁTIL Karel NEŠPŮREK Stanislav HUMLÍČEK Josef
Year of publication	2004
Type	Article in Periodical
Magazine / Source	Thin Solid Films
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	temperature; ellipsometric spectra; poly(methyl-phenylsilane);
Description	Comprehensive study of the temperature dependence of ultraviolet-visible ellipsometric spectra of thin films of poly(methyl-phenylsilane). It was found the threshold of irreversible changes of its optical response at 373 K and furthermore the average temperature shift of the lowest excitonic band in the reversible regime.The effect of annealing below and above 373 is studied with low- a high-level of the exposure to UV light.
Related projects:	Physical properties of new materials and layered structures