Deposition of hard thin films from HMDSO in atmospheric pressure dielectric barrier discharge

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Authors

TRUNEC David ZAJÍČKOVÁ Lenka BURŠÍKOVÁ Vilma STUDNIČKA Filip SŤAHEL Pavel PRYSIAZHNYI Vadym PEŘINA Vratislav HOUDKOVÁ Jana NAVRÁTIL Zdeněk FRANTA Daniel

Year of publication 2010
Type Article in Periodical
Magazine / Source Journal of Physics D: Applied Physics
MU Faculty or unit

Faculty of Science

Citation
Web http://iopscience.iop.org/0022-3727/43/22/225403/pdf/0022-3727_43_22_225403.pdf
Field Plasma physics
Keywords thin film deposition; atmospheric pressure discharge
Description An atmospheric pressure dielectric barrier discharge burning in nitrogen with a small admixture of hexamethyldisiloxane (HMDSO) was used for the deposition of thin organosilicon films. The thin films were deposited on glass, silicon and polycarbonate substrates, and the substrate temperature during the deposition process was increased up to values within the range 25 - 150 C in order to obtain hard SiOx-like thin films.
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